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    Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients

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    Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients

    New search for: Chen, R.
    New search for: Xu, W.
    New search for: Chen, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients

    New search for: Chen, R.
    New search for: Xu, W.
    New search for: Chen, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients

    Contributors:

    Chen, R. (author) / Xu, W. (author) / Chen, Y. (author)

    Published in:

    JOURNAL OF GEOTECHNICAL AND GEOENVIRONMENTAL ENGINEERING ; 135 ; 1883-1891

    Publication date:

    2009-01-01

    Size:

    9 pages

    ISSN:

    1090-0241

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  624

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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