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    Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

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    New search for: Yen, L. C.

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    Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

    New search for: Pan, T. M.
    New search for: Yen, L. C.

    Access

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    Check availability in my library
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    Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

    New search for: Pan, T. M.
    New search for: Yen, L. C.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

    Contributors:

    Pan, T. M. (author) / Yen, L. C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 2786-2791

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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