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    Stress gradients observed in Cu thin films induced by capping layers

    New search for: Murray, C.E.
    New search for: Besser, P.R.
    New search for: Witt, C.
    New search for: Jordan-Sweet, J.L.

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    Stress gradients observed in Cu thin films induced by capping layers

    New search for: Murray, C.E.
    New search for: Besser, P.R.
    New search for: Witt, C.
    New search for: Jordan-Sweet, J.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Stress gradients observed in Cu thin films induced by capping layers

    New search for: Murray, C.E.
    New search for: Besser, P.R.
    New search for: Witt, C.
    New search for: Jordan-Sweet, J.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Stress gradients observed in Cu thin films induced by capping layers

    Contributors:

    Murray, C.E. (author) / Besser, P.R. (author) / Witt, C. (author) / Jordan-Sweet, J.L. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 25 ; 622-628

    Publication date:

    2010-01-01

    Size:

    7 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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