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Electromechanical Characterization of Au Thin Films using Micro-tensile Testing

Lee, S. J. / Park, J. M. / Han, S. W. / Hyun, S. M. / Kim, J. H. / Lee, H. J.

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Electromechanical Characterization of Au Thin Films using Micro-tensile Testing

Lee, S. J. / Park, J. M. / Han, S. W. / Hyun, S. M. / Kim, J. H. / Lee, H. J.

Electromechanical Characterization of Au Thin Films using Micro-tensile Testing

Lee, S. J. / Park, J. M. / Han, S. W. / Hyun, S. M. / Kim, J. H. / Lee, H. J.

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Check availability in my library

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Document information

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Document information

Title:

Electromechanical Characterization of Au Thin Films using Micro-tensile Testing

Contributors:

Lee, S. J. (author) / Park, J. M. (author) / Han, S. W. (author) / Hyun, S. M. (author) / Kim, J. H. (author) / Lee, H. J. (author)

Published in:

EXPERIMENTAL MECHANICS ; 50 ; 643-649

Publication date:

2010-01-01

Size:

7 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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