Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electromechanical Characterization of Au Thin Films using Micro-tensile Testing
Electromechanical Characterization of Au Thin Films using Micro-tensile Testing
Electromechanical Characterization of Au Thin Films using Micro-tensile Testing
Lee, S. J. (Autor:in) / Park, J. M. (Autor:in) / Han, S. W. (Autor:in) / Hyun, S. M. (Autor:in) / Kim, J. H. (Autor:in) / Lee, H. J. (Autor:in)
EXPERIMENTAL MECHANICS ; 50 ; 643-649
01.01.2010
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1
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