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    Metastable Defects in Low-Energy Electron Irradiated n-Type 4H-SiC

    New search for: Beyer, F.C.
    New search for: Hemmingsson, C.
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    Metastable Defects in Low-Energy Electron Irradiated n-Type 4H-SiC

    New search for: Beyer, F.C.
    New search for: Hemmingsson, C.
    New search for: Pedersen, H.
    New search for: Henry, A.
    New search for: Isoya, J.
    New search for: Morishita, N.
    New search for: Ohshima, T.
    New search for: Janzen, E.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Metastable Defects in Low-Energy Electron Irradiated n-Type 4H-SiC

    New search for: Beyer, F.C.
    New search for: Hemmingsson, C.
    New search for: Pedersen, H.
    New search for: Henry, A.
    New search for: Isoya, J.
    New search for: Morishita, N.
    New search for: Ohshima, T.
    New search for: Janzen, E.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
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    Order at Subito €

    Access

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    Document information
    Title:

    Metastable Defects in Low-Energy Electron Irradiated n-Type 4H-SiC

    Contributors:

    Beyer, F.C. (author) / Hemmingsson, C. (author) / Pedersen, H. (author) / Henry, A. (author) / Isoya, J. (author) / Morishita, N. (author) / Ohshima, T. (author) / Janzen, E. (author) / Bauer, A.J. / Friedrichs, P.

    Published in:

    Silicon Carbide and Related Materials 2009 ; 435-438

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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