Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Experimental determination of valence band offset at PbTe/Ge(100) interface by synchrotron radiation photoelectron spectroscopy

    New search for: Cai, C. F.
    New search for: Wu, H. Z.
    New search for: Si, J. X.
    New search for: Zhang, W. H.
    New search for: Xu, Y.
    New search for: Zhu, J. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Experimental determination of valence band offset at PbTe/Ge(100) interface by synchrotron radiation photoelectron spectroscopy

    New search for: Cai, C. F.
    New search for: Wu, H. Z.
    New search for: Si, J. X.
    New search for: Zhang, W. H.
    New search for: Xu, Y.
    New search for: Zhu, J. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Experimental determination of valence band offset at PbTe/Ge(100) interface by synchrotron radiation photoelectron spectroscopy

    New search for: Cai, C. F.
    New search for: Wu, H. Z.
    New search for: Si, J. X.
    New search for: Zhang, W. H.
    New search for: Xu, Y.
    New search for: Zhu, J. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Experimental determination of valence band offset at PbTe/Ge(100) interface by synchrotron radiation photoelectron spectroscopy

    Contributors:

    Cai, C. F. (author) / Wu, H. Z. (author) / Si, J. X. (author) / Zhang, W. H. (author) / Xu, Y. (author) / Zhu, J. F. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 6057-6059

    Publication date:

    2010-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy

    Shi, K. / Liu, X. L. / Li, D. B. et al. | British Library Online Contents | 2011

    Valence band offset of MgO/TiO2 (rutile) heterojunction measured by X-ray photoelectron spectroscopy

    Zheng, G. / Wang, J. / Liu, X. et al. | British Library Online Contents | 2010

    Valence bands offset between depleted semiconductors measured by photoelectron spectroscopy

    Kumar, S. / Jha, S. N. / Ganguli, T. et al. | British Library Online Contents | 2004

    Synchrotron radiation photoelectron spectroscopy study of ITO surface

    Lai, B. / Ding, X. M. / Yuan, Z. L. et al. | British Library Online Contents | 2000

    Band offset in zinc oxy-sulfide/cubic-tin sulfide interface from X-ray photoelectron spectroscopy

    K.C., Sanal / Nair, P.K. / Nair, M.T.S. | British Library Online Contents | 2017

    Back to top