Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy: Fid-Bau Portal

Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy

Shi, K. / Liu, X. L. / Li, D. B. / Wang, J. / Song, H. P. / Xu, X. Q. / Wei, H. Y. / Jiao, C. M. / Yang, S. Y. / Song, H.

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Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy

Shi, K. / Liu, X. L. / Li, D. B. / Wang, J. / Song, H. P. / Xu, X. Q. / Wei, H. Y. / Jiao, C. M. / Yang, S. Y. / Song, H.

Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy

Shi, K. / Liu, X. L. / Li, D. B. / Wang, J. / Song, H. P. / Xu, X. Q. / Wei, H. Y. / Jiao, C. M. / Yang, S. Y. / Song, H.

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Document information

Title:

Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy

Contributors:

Shi, K. (author) / Liu, X. L. (author) / Li, D. B. (author) / Wang, J. (author) / Song, H. P. (author) / Xu, X. Q. (author) / Wei, H. Y. (author) / Jiao, C. M. (author) / Yang, S. Y. (author) / Song, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 257 ; 8110-8112

Publication date:

2011-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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