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    Uncertainty Analysis of Helical Deviation Measurements

    New search for: Shi, Z.Y.
    New search for: Lin, J.C.
    New search for: Krystek, M.P.
    New search for: Chugui, Y.
    New search for: Gao, Y.
    New search for: Fan, K.-C.
    New search for: Taymanov, R.
    New search for: Sapozhnikova, K.

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    Uncertainty Analysis of Helical Deviation Measurements

    New search for: Shi, Z.Y.
    New search for: Lin, J.C.
    New search for: Krystek, M.P.
    New search for: Chugui, Y.
    New search for: Gao, Y.
    New search for: Fan, K.-C.
    New search for: Taymanov, R.
    New search for: Sapozhnikova, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Uncertainty Analysis of Helical Deviation Measurements

    New search for: Shi, Z.Y.
    New search for: Lin, J.C.
    New search for: Krystek, M.P.
    New search for: Chugui, Y.
    New search for: Gao, Y.
    New search for: Fan, K.-C.
    New search for: Taymanov, R.
    New search for: Sapozhnikova, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Uncertainty Analysis of Helical Deviation Measurements

    Contributors:

    Shi, Z.Y. (author) / Lin, J.C. (author) / Krystek, M.P. (author) / Chugui, Y. / Gao, Y. / Fan, K.-C. / Taymanov, R. / Sapozhnikova, K.

    Published in:

    Measurement Technology and Intelligent Instruments IX ; 212-216

    KEY ENGINEERING MATERIALS ; 437

    Publication date:

    2010-01-01

    Size:

    5 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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