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    XPS analysis for degraded Y2SiO5:Ce phosphor thin films

    New search for: Coetsee, E.
    New search for: Terblans, J. J.
    New search for: Swart, H. C.

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    XPS analysis for degraded Y2SiO5:Ce phosphor thin films

    New search for: Coetsee, E.
    New search for: Terblans, J. J.
    New search for: Swart, H. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    XPS analysis for degraded Y2SiO5:Ce phosphor thin films

    New search for: Coetsee, E.
    New search for: Terblans, J. J.
    New search for: Swart, H. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    XPS analysis for degraded Y2SiO5:Ce phosphor thin films

    Contributors:

    Coetsee, E. (author) / Terblans, J. J. (author) / Swart, H. C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 6641-6648

    Publication date:

    2010-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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