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    Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

    New search for: Tang, F.Z.
    New search for: Alam, T.
    New search for: Moody, M.P.
    New search for: Gault, B.
    New search for: Cairney, J.M.
    New search for: Nie, J.-F.
    New search for: Morton, A.

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    Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

    New search for: Tang, F.Z.
    New search for: Alam, T.
    New search for: Moody, M.P.
    New search for: Gault, B.
    New search for: Cairney, J.M.
    New search for: Nie, J.-F.
    New search for: Morton, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

    New search for: Tang, F.Z.
    New search for: Alam, T.
    New search for: Moody, M.P.
    New search for: Gault, B.
    New search for: Cairney, J.M.
    New search for: Nie, J.-F.
    New search for: Morton, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

    Contributors:

    Tang, F.Z. (author) / Alam, T. (author) / Moody, M.P. (author) / Gault, B. (author) / Cairney, J.M. (author) / Nie, J.-F. / Morton, A.

    Published in:

    PRICM7 PART 3 ; 2366-2369

    MATERIALS SCIENCE FORUM ; 654/656

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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