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    Atom probe tomography—A cornerstone in materials characterization

    New search for: Amouyal, Yaron
    New search for: Schmitz, Guido

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    Atom probe tomography—A cornerstone in materials characterization

    New search for: Amouyal, Yaron
    New search for: Schmitz, Guido

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atom probe tomography—A cornerstone in materials characterization

    New search for: Amouyal, Yaron
    New search for: Schmitz, Guido

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Atom probe tomography—A cornerstone in materials characterization

    Contributors:

    Amouyal, Yaron (author) / Schmitz, Guido (author)

    Published in:

    MRS bulletin ; 41 ; 13-13

    Publication date:

    2016-01-01

    Size:

    1 pages

    ISSN:

    0883-7694

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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