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    Inelastic Electron Tunneling Spectroscopy Study of Thin Gate Dielectrics

    New search for: Reiner, J. W.
    New search for: Cui, S.
    New search for: Liu, Z.
    New search for: Wang, M.
    New search for: Ahn, C. H.
    New search for: Ma, T. P.

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    Inelastic Electron Tunneling Spectroscopy Study of Thin Gate Dielectrics

    New search for: Reiner, J. W.
    New search for: Cui, S.
    New search for: Liu, Z.
    New search for: Wang, M.
    New search for: Ahn, C. H.
    New search for: Ma, T. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Inelastic Electron Tunneling Spectroscopy Study of Thin Gate Dielectrics

    New search for: Reiner, J. W.
    New search for: Cui, S.
    New search for: Liu, Z.
    New search for: Wang, M.
    New search for: Ahn, C. H.
    New search for: Ma, T. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Inelastic Electron Tunneling Spectroscopy Study of Thin Gate Dielectrics

    Contributors:

    Reiner, J. W. (author) / Cui, S. (author) / Liu, Z. (author) / Wang, M. (author) / Ahn, C. H. (author) / Ma, T. P. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 22 ; 2962-2968

    Publication date:

    2010-01-01

    Size:

    7 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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