Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy: Fid-Bau Portal

Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

Lee, K. / Oh, M. S. / Mun, S. j. / Lee, K. H. / Ha, T. W. / Kim, J. H. / Park, S. H. / Hwang, C. S. / Lee, B. H. / Sung, M. M.

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Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

Lee, K. / Oh, M. S. / Mun, S. j. / Lee, K. H. / Ha, T. W. / Kim, J. H. / Park, S. H. / Hwang, C. S. / Lee, B. H. / Sung, M. M.

Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

Lee, K. / Oh, M. S. / Mun, S. j. / Lee, K. H. / Ha, T. W. / Kim, J. H. / Park, S. H. / Hwang, C. S. / Lee, B. H. / Sung, M. M.

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Title:

Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

Contributors:

Lee, K. (author) / Oh, M. S. (author) / Mun, S. j. (author) / Lee, K. H. (author) / Ha, T. W. (author) / Kim, J. H. (author) / Park, S. H. (author) / Hwang, C. S. (author) / Lee, B. H. (author) / Sung, M. M. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 22 ; 3260-3265

Publication date:

2010-01-01

Size:

6 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Park, J. H. / Kang, C. H. / Kim, Y. J. et al. | British Library Online Contents | 2004

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