Secondary ion mass spectrometry study of photorefractive-damage-resistant locally Er/Mg-doped near-stoichiometric Ti:Mg:Er:LiNbO~3 strip waveguides: Fid-Bau Portal

Secondary ion mass spectrometry study of photorefractive-damage-resistant locally Er/Mg-doped near-stoichiometric Ti:Mg:Er:LiNbO~3 strip waveguides

Zhang, D.-L. / Hua, P.-R. / Qi, L. / Chen, B. / Pun, E.Y.-B.

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Secondary ion mass spectrometry study of photorefractive-damage-resistant locally Er/Mg-doped near-stoichiometric Ti:Mg:Er:LiNbO~3 strip waveguides

Zhang, D.-L. / Hua, P.-R. / Qi, L. / Chen, B. / Pun, E.Y.-B.

Secondary ion mass spectrometry study of photorefractive-damage-resistant locally Er/Mg-doped near-stoichiometric Ti:Mg:Er:LiNbO~3 strip waveguides

Zhang, D.-L. / Hua, P.-R. / Qi, L. / Chen, B. / Pun, E.Y.-B.

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Document information

Title:

Secondary ion mass spectrometry study of photorefractive-damage-resistant locally Er/Mg-doped near-stoichiometric Ti:Mg:Er:LiNbO~3 strip waveguides

Contributors:

Zhang, D.-L. (author) / Hua, P.-R. (author) / Qi, L. (author) / Chen, B. (author) / Pun, E.Y.-B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 25 ; 1822-1832

Publication date:

2010-01-01

Size:

11 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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