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    Characterization of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

    New search for: Jiang, L.
    New search for: Zhou, Y.
    New search for: Hao, H.
    New search for: Liao, Y.
    New search for: Lu, C.

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    Characterization of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

    New search for: Jiang, L.
    New search for: Zhou, Y.
    New search for: Hao, H.
    New search for: Liao, Y.
    New search for: Lu, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

    New search for: Jiang, L.
    New search for: Zhou, Y.
    New search for: Hao, H.
    New search for: Liao, Y.
    New search for: Lu, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

    Contributors:

    Jiang, L. (author) / Zhou, Y. (author) / Hao, H. (author) / Liao, Y. (author) / Lu, C. (author)

    Published in:

    MECHANICS OF MATERIALS ; 42 ; 908-915

    Publication date:

    2010-01-01

    Size:

    8 pages

    ISSN:

    0167-6636

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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