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Quantification of void network architectures of suspension plasma-sprayed (SPS) yttria-stabilized zirconia (YSZ) coatings using Ultra-small-angle X-ray scattering (USAXS)
Quantification of void network architectures of suspension plasma-sprayed (SPS) yttria-stabilized zirconia (YSZ) coatings using Ultra-small-angle X-ray scattering (USAXS)
Quantification of void network architectures of suspension plasma-sprayed (SPS) yttria-stabilized zirconia (YSZ) coatings using Ultra-small-angle X-ray scattering (USAXS)
Bacciochini, A. (author) / Ilavsky, J. (author) / Montavon, G. (author) / Denoirjean, A. (author) / Ben-ettouil, F. (author) / Valette, S. (author) / Fauchais, P. (author) / Wittmann-teneze, K. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 91-102
2010-01-01
12 pages
Article (Journal)
English
DDC:
620.11
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