Mapping microstructure inhomogeneity using electron backscatter diffraction in 316L stainless steel subjected to hot plane strain compression tests: Fid-Bau Portal

Mapping microstructure inhomogeneity using electron backscatter diffraction in 316L stainless steel subjected to hot plane strain compression tests

Sun, L. / Thomas, M.J. / Wynne, B.P. / Palmiere, E.J. / Mingard, K.P. / Roebuck, B.

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Mapping microstructure inhomogeneity using electron backscatter diffraction in 316L stainless steel subjected to hot plane strain compression tests

Sun, L. / Thomas, M.J. / Wynne, B.P. / Palmiere, E.J. / Mingard, K.P. / Roebuck, B.

Mapping microstructure inhomogeneity using electron backscatter diffraction in 316L stainless steel subjected to hot plane strain compression tests

Sun, L. / Thomas, M.J. / Wynne, B.P. / Palmiere, E.J. / Mingard, K.P. / Roebuck, B.

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Check availability in my library

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Document information

Title:

Mapping microstructure inhomogeneity using electron backscatter diffraction in 316L stainless steel subjected to hot plane strain compression tests

Contributors:

Sun, L. (author) / Thomas, M.J. (author) / Wynne, B.P. (author) / Palmiere, E.J. (author) / Mingard, K.P. (author) / Roebuck, B. (author)

Published in:

MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 26 ; 1477-1486

Publication date:

2010-01-01

Size:

10 pages

ISSN:

0267-0836

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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