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Irradiation-induced defect clustering and amorphization in silicon carbide

Weber, W.J. / Gao, F.

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Irradiation-induced defect clustering and amorphization in silicon carbide

Weber, W.J. / Gao, F.

Irradiation-induced defect clustering and amorphization in silicon carbide

Weber, W.J. / Gao, F.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Irradiation-induced defect clustering and amorphization in silicon carbide

Contributors:

Weber, W.J. (author) / Gao, F. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 25 ; 2349-2353

Publication date:

2010-01-01

Size:

5 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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