A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method: Fid-Bau Portal

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

Murugesan, S. / Padhy, N. / Kuppusami, P. / Mudali, U. K. / Mohandas, E.

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A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

Murugesan, S. / Padhy, N. / Kuppusami, P. / Mudali, U. K. / Mohandas, E.

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

Murugesan, S. / Padhy, N. / Kuppusami, P. / Mudali, U. K. / Mohandas, E.

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Check availability in my library

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Document information

Title:

A study of structural transition in nanocrystalline titania thin films by X-ray diffraction Rietveld method

Contributors:

Murugesan, S. (author) / Padhy, N. (author) / Kuppusami, P. (author) / Mudali, U. K. (author) / Mohandas, E. (author)

Published in:

MATERIALS RESEARCH BULLETIN ; 45 ; 1973-1977

Publication date:

2010-01-01

Size:

5 pages

ISSN:

0025-5408

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11 / 620

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