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Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
Lutterotti, L. (author) / Matthies, S. (author) / Chateigner, D. (author) / Ferrari, S. (author) / Ricote, J. (author) / Lee, D. N.
2002-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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