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    Identification of atomic steps at AlSb/GaAs hetero-epitaxial interface using geometric phase method by high-resolution electron microscopy

    New search for: He, X. Q.
    New search for: Wen, C.
    New search for: Duan, X. F.
    New search for: Chen, H.

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    Identification of atomic steps at AlSb/GaAs hetero-epitaxial interface using geometric phase method by high-resolution electron microscopy

    New search for: He, X. Q.
    New search for: Wen, C.
    New search for: Duan, X. F.
    New search for: Chen, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Identification of atomic steps at AlSb/GaAs hetero-epitaxial interface using geometric phase method by high-resolution electron microscopy

    New search for: He, X. Q.
    New search for: Wen, C.
    New search for: Duan, X. F.
    New search for: Chen, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Identification of atomic steps at AlSb/GaAs hetero-epitaxial interface using geometric phase method by high-resolution electron microscopy

    Contributors:

    He, X. Q. (author) / Wen, C. (author) / Duan, X. F. (author) / Chen, H. (author)

    Published in:

    MATERIALS LETTERS ; 65 ; 456-459

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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