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Test Approach Based on Decision Diagrams for Delay Fault Caused by Crosstalk Interferences in Digital Circuits
Test Approach Based on Decision Diagrams for Delay Fault Caused by Crosstalk Interferences in Digital Circuits
Test Approach Based on Decision Diagrams for Delay Fault Caused by Crosstalk Interferences in Digital Circuits
Pan, Z.L. (author) / Chen, L. (author) / Huang, Y.M.
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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