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    Detection of Crosstalk Faults in Digital Circuits by Testability Evaluation

    New search for: Chen, L.
    New search for: Pan, Z.L.
    New search for: Wu, Y.

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    Detection of Crosstalk Faults in Digital Circuits by Testability Evaluation

    New search for: Chen, L.
    New search for: Pan, Z.L.
    New search for: Wu, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Detection of Crosstalk Faults in Digital Circuits by Testability Evaluation

    New search for: Chen, L.
    New search for: Pan, Z.L.
    New search for: Wu, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Detection of Crosstalk Faults in Digital Circuits by Testability Evaluation

    Contributors:

    Chen, L. (author) / Pan, Z.L. (author) / Wu, Y.

    Published in:

    Advanced Measurement and Test ; 1241-1246

    KEY ENGINEERING MATERIALS ; 439/440

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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