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Analysis of Stress in Aircraft Components Using Lock-In Thermography

Liu, X. / Liu, J.Y. / Li, X.D. / Zhang, G.Y.

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Analysis of Stress in Aircraft Components Using Lock-In Thermography

Liu, X. / Liu, J.Y. / Li, X.D. / Zhang, G.Y.

Analysis of Stress in Aircraft Components Using Lock-In Thermography

Liu, X. / Liu, J.Y. / Li, X.D. / Zhang, G.Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Analysis of Stress in Aircraft Components Using Lock-In Thermography

Contributors:

Liu, X. (author) / Liu, J.Y. (author) / Li, X.D. (author) / Zhang, G.Y. (author) / Huang, Y.M.

Published in:

Optoelectronic Materials ; 1073-1076

MATERIALS SCIENCE FORUM ; 663/665

Publication date:

2011-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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