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    Analysis on data storage area of NiO-ReRAM with secondary electron image

    New search for: Kinoshita, K.
    New search for: Makino, T.
    New search for: Yoda, T.
    New search for: Dobashi, K.
    New search for: Kishida, S.

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    Analysis on data storage area of NiO-ReRAM with secondary electron image

    New search for: Kinoshita, K.
    New search for: Makino, T.
    New search for: Yoda, T.
    New search for: Dobashi, K.
    New search for: Kishida, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis on data storage area of NiO-ReRAM with secondary electron image

    New search for: Kinoshita, K.
    New search for: Makino, T.
    New search for: Yoda, T.
    New search for: Dobashi, K.
    New search for: Kishida, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Analysis on data storage area of NiO-ReRAM with secondary electron image

    Contributors:

    Kinoshita, K. (author) / Makino, T. (author) / Yoda, T. (author) / Dobashi, K. (author) / Kishida, S. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 45-49

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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