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Nanostructural characterization of TiN-Ni films: A XAFS study
Nanostructural characterization of TiN-Ni films: A XAFS study
Nanostructural characterization of TiN-Ni films: A XAFS study
Pinakidou, F. (author) / Katsikini, M. (author) / Paloura, E. C. (author) / Akbari, A. (author) / Riviere, J. P. (author)
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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