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    Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

    New search for: Wang, Z. M.
    New search for: Gu, L.
    New search for: Jeurgens, L. P.
    New search for: Mittemeijer, E. J.

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    Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

    New search for: Wang, Z. M.
    New search for: Gu, L.
    New search for: Jeurgens, L. P.
    New search for: Mittemeijer, E. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

    New search for: Wang, Z. M.
    New search for: Gu, L.
    New search for: Jeurgens, L. P.
    New search for: Mittemeijer, E. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

    Contributors:

    Wang, Z. M. (author) / Gu, L. (author) / Jeurgens, L. P. (author) / Mittemeijer, E. J. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 46 ; 4314-4317

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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