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    Acoustic Microimaging Allows Sequential Depth Analysis of Ceramic Capacitor

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    Acoustic Microimaging Allows Sequential Depth Analysis of Ceramic Capacitor

    New search for: Adams, T.

    Access

    Access via TIB
    Check availability in my library
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    Acoustic Microimaging Allows Sequential Depth Analysis of Ceramic Capacitor

    New search for: Adams, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Acoustic Microimaging Allows Sequential Depth Analysis of Ceramic Capacitor

    Contributors:

    Adams, T. (author)

    Published in:

    ADVANCED MATERIALS AND PROCESSES ; 169 ; 26-28

    Publication date:

    2011-01-01

    Size:

    3 pages

    ISSN:

    0882-7958

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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