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Fatigue strength of the Cu/Si interface in nano-components
Fatigue strength of the Cu/Si interface in nano-components
Fatigue strength of the Cu/Si interface in nano-components
Sumigawa, T. (author) / Kitamura, T. (author) / Murakami, T. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 5158-5163
2011-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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