Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Fatigue strength of the Cu/Si interface in nano-components
Fatigue strength of the Cu/Si interface in nano-components
Fatigue strength of the Cu/Si interface in nano-components
Sumigawa, T. (Autor:in) / Kitamura, T. (Autor:in) / Murakami, T. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 5158-5163
01.01.2011
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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