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Observation of regular defects formed on the surface of PbTe thin films grown by molecular beam epitaxy

Zhang, B. / Cai, C. / Hu, L. / Wei, X. / Wu, H.

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Observation of regular defects formed on the surface of PbTe thin films grown by molecular beam epitaxy

Zhang, B. / Cai, C. / Hu, L. / Wei, X. / Wu, H.

Observation of regular defects formed on the surface of PbTe thin films grown by molecular beam epitaxy

Zhang, B. / Cai, C. / Hu, L. / Wei, X. / Wu, H.

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Order at Subito €

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Document information

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Document information

Title:

Observation of regular defects formed on the surface of PbTe thin films grown by molecular beam epitaxy

Contributors:

Zhang, B. (author) / Cai, C. (author) / Hu, L. (author) / Wei, X. (author) / Wu, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 257 ; 1986-1989

Publication date:

2011-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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