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    Study of rapid grain boundary migration in a nanocrystalline Ni thin film

    New search for: Kacher, J.
    New search for: Robertson, I. M.
    New search for: Nowell, M.
    New search for: Knapp, J.
    New search for: Hattar, K.

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    Study of rapid grain boundary migration in a nanocrystalline Ni thin film

    New search for: Kacher, J.
    New search for: Robertson, I. M.
    New search for: Nowell, M.
    New search for: Knapp, J.
    New search for: Hattar, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study of rapid grain boundary migration in a nanocrystalline Ni thin film

    New search for: Kacher, J.
    New search for: Robertson, I. M.
    New search for: Nowell, M.
    New search for: Knapp, J.
    New search for: Hattar, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Study of rapid grain boundary migration in a nanocrystalline Ni thin film

    Contributors:

    Kacher, J. (author) / Robertson, I. M. (author) / Nowell, M. (author) / Knapp, J. (author) / Hattar, K. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 1628-1635

    Publication date:

    2011-01-01

    Size:

    8 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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