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    Effects of Impurities Distribution on the Crystal Structure and Electrical Properties of Multi-Crystalline Silicon Ingots

    New search for: Xing, Q.Z.
    New search for: Dong, W.
    New search for: Shi, S.
    New search for: Li, G.B.
    New search for: Tan, Y.
    New search for: Tan, Y.
    New search for: Ju, D.

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    Effects of Impurities Distribution on the Crystal Structure and Electrical Properties of Multi-Crystalline Silicon Ingots

    New search for: Xing, Q.Z.
    New search for: Dong, W.
    New search for: Shi, S.
    New search for: Li, G.B.
    New search for: Tan, Y.
    New search for: Tan, Y.
    New search for: Ju, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of Impurities Distribution on the Crystal Structure and Electrical Properties of Multi-Crystalline Silicon Ingots

    New search for: Xing, Q.Z.
    New search for: Dong, W.
    New search for: Shi, S.
    New search for: Li, G.B.
    New search for: Tan, Y.
    New search for: Tan, Y.
    New search for: Ju, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Effects of Impurities Distribution on the Crystal Structure and Electrical Properties of Multi-Crystalline Silicon Ingots

    Contributors:

    Xing, Q.Z. (author) / Dong, W. (author) / Shi, S. (author) / Li, G.B. (author) / Tan, Y. (author) / Tan, Y. / Ju, D.

    Published in:

    Advanced Material Science and Technology ; 101-104

    MATERIALS SCIENCE FORUM ; 675/677

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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