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Observation of Bistable Defects in Electron Irradiated N-Type 4H-SiC
Observation of Bistable Defects in Electron Irradiated N-Type 4H-SiC
Observation of Bistable Defects in Electron Irradiated N-Type 4H-SiC
Beyer, F.C. (author) / Hemmingsson, C. (author) / Pedersen, H. (author) / Henry, A. (author) / Isoya, J. (author) / Morishita, N. (author) / Ohshima, T. (author) / Janzen, E. (author) / Monakhov, E.V. / Hornos, T.
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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