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Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact
Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact
Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact
Takada, Y. (author) / Muraguchi, M. (author) / Endoh, T. (author) / Nomura, S. (author) / Shiraishi, K. (author) / Miyazaki, S. / Tabata, H.
2011-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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