Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions: Fid-Bau Portal

Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions

Alaboson, J. M. / Wang, Q. H. / Kellar, J. A. / Park, J. / Elam, J. W. / Pellin, M. J. / Hersam, M. C.

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Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions

Alaboson, J. M. / Wang, Q. H. / Kellar, J. A. / Park, J. / Elam, J. W. / Pellin, M. J. / Hersam, M. C.

Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions

Alaboson, J. M. / Wang, Q. H. / Kellar, J. A. / Park, J. / Elam, J. W. / Pellin, M. J. / Hersam, M. C.

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Document information

Title:

Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions

Contributors:

Alaboson, J. M. (author) / Wang, Q. H. (author) / Kellar, J. A. (author) / Park, J. (author) / Elam, J. W. (author) / Pellin, M. J. (author) / Hersam, M. C. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 23 ; 2181-2184

Publication date:

2011-01-01

Size:

4 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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