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Thermal shock induced nanocrack as high efficiency surface conduction electron emitter

Chen, B. / Liu, H. / Wang, H. / Fan, F. / Wang, L. / Ding, Y. / Lu, B.

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Thermal shock induced nanocrack as high efficiency surface conduction electron emitter

Chen, B. / Liu, H. / Wang, H. / Fan, F. / Wang, L. / Ding, Y. / Lu, B.

Thermal shock induced nanocrack as high efficiency surface conduction electron emitter

Chen, B. / Liu, H. / Wang, H. / Fan, F. / Wang, L. / Ding, Y. / Lu, B.

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Check availability in my library

Order at Subito €

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Document information

Title:

Thermal shock induced nanocrack as high efficiency surface conduction electron emitter

Contributors:

Chen, B. (author) / Liu, H. (author) / Wang, H. (author) / Fan, F. (author) / Wang, L. (author) / Ding, Y. (author) / Lu, B. (author)

Published in:

APPLIED SURFACE SCIENCE ; 257 ; 9125-9128

Publication date:

2011-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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