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In Situ X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films
In Situ X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films
In Situ X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films
Cao, J.L. (author) / Zhang, K. (author) / Solbach, A. (author) / Yue, Z.X. (author) / Wang, H.H. (author) / Chen, Y. (author) / Klemradt, U. (author) / Li, C. / Jiang, C. / Zhong, Z.
2011-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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