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The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)
The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)
The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)
Fattah-alhosseini, A. (author) / Soltani, F. (author) / Shirsalimi, F. (author) / Ezadi, B. (author) / Attarzadeh, N. (author)
CORROSION SCIENCE ; 53 ; 3186-3192
2011-01-01
7 pages
Article (Journal)
English
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