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    The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

    New search for: Fattah-alhosseini, A.
    New search for: Soltani, F.
    New search for: Shirsalimi, F.
    New search for: Ezadi, B.
    New search for: Attarzadeh, N.

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    The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

    New search for: Fattah-alhosseini, A.
    New search for: Soltani, F.
    New search for: Shirsalimi, F.
    New search for: Ezadi, B.
    New search for: Attarzadeh, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

    New search for: Fattah-alhosseini, A.
    New search for: Soltani, F.
    New search for: Shirsalimi, F.
    New search for: Ezadi, B.
    New search for: Attarzadeh, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

    Contributors:

    Fattah-alhosseini, A. (author) / Soltani, F. (author) / Shirsalimi, F. (author) / Ezadi, B. (author) / Attarzadeh, N. (author)

    Published in:

    CORROSION SCIENCE ; 53 ; 3186-3192

    Publication date:

    2011-01-01

    Size:

    7 pages

    ISSN:

    0010-938X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.16205 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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