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    Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films

    New search for: Balakrishnan, V.
    New search for: Ko, C.
    New search for: Ramanathan, S.

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    Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films

    New search for: Balakrishnan, V.
    New search for: Ko, C.
    New search for: Ramanathan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films

    New search for: Balakrishnan, V.
    New search for: Ko, C.
    New search for: Ramanathan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films

    Contributors:

    Balakrishnan, V. (author) / Ko, C. (author) / Ramanathan, S. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 1384-1387

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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