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Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films
Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films
Size effects on stress relaxation across the metal-insulator transition in VO~2 thin films
Balakrishnan, V. (Autor:in) / Ko, C. (Autor:in) / Ramanathan, S. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 1384-1387
01.01.2011
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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