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Depth-resolved residual stress analysis of thin coatings by a new FIB-DIC method

Sebastiani, M. / Eberl, C. / Bemporad, E. / Pharr, G. M.

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Depth-resolved residual stress analysis of thin coatings by a new FIB-DIC method

Sebastiani, M. / Eberl, C. / Bemporad, E. / Pharr, G. M.

Depth-resolved residual stress analysis of thin coatings by a new FIB-DIC method

Sebastiani, M. / Eberl, C. / Bemporad, E. / Pharr, G. M.

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Order at Subito €

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Document information

Title:

Depth-resolved residual stress analysis of thin coatings by a new FIB-DIC method

Contributors:

Sebastiani, M. (author) / Eberl, C. (author) / Bemporad, E. (author) / Pharr, G. M. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 7901-7908

Publication date:

2011-01-01

Size:

8 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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