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Dielectric Properties of Bismuth Layer-Structured Oxide Thin Films with Preferential Crystal Orientation at High-Temperature
Dielectric Properties of Bismuth Layer-Structured Oxide Thin Films with Preferential Crystal Orientation at High-Temperature
Dielectric Properties of Bismuth Layer-Structured Oxide Thin Films with Preferential Crystal Orientation at High-Temperature
Mizutani, Y. (author) / Kimura, J. (author) / Takuwa, I. (author) / Yamada, T. (author) / Funakubo, H. (author) / Uchida, H. (author) / Shinozaki, K. / Fujihara, S. / Chazono, H.
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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