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Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches

Alam, M.A. / Azarian, M.H. / Osterman, M. / Pecht, M.

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Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches

Alam, M.A. / Azarian, M.H. / Osterman, M. / Pecht, M.

Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches

Alam, M.A. / Azarian, M.H. / Osterman, M. / Pecht, M.

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Title:

Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches

Contributors:

Alam, M.A. (author) / Azarian, M.H. (author) / Osterman, M. (author) / Pecht, M. (author)

Published in:

JOURNAL OF INTELLIGENT MATERIAL SYSTEMS AND STRUCTURES ; 22 ; 1293-1304

Publication date:

2011-01-01

Size:

12 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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