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Recovery stress and shape memory stability in Ni-Ti-Cu thin wires at high temperatures
Recovery stress and shape memory stability in Ni-Ti-Cu thin wires at high temperatures
Recovery stress and shape memory stability in Ni-Ti-Cu thin wires at high temperatures
Molnar, P. (author) / Van Humbeeck, J. (author)
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 102 ; 1362-1368
2011-01-01
7 pages
Article (Journal)
English
DDC:
669.9
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