A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Crack Detection in Full Size Cz-Silicon Wafers Using Lamb Wave Air Coupled Ultrasonic Testing (LAC-UT)
Crack Detection in Full Size Cz-Silicon Wafers Using Lamb Wave Air Coupled Ultrasonic Testing (LAC-UT)
Crack Detection in Full Size Cz-Silicon Wafers Using Lamb Wave Air Coupled Ultrasonic Testing (LAC-UT)
Chakrapani, S. K. (author) / Padiyar, M. J. (author) / Balasubramaniam, K. (author)
JOURNAL OF NONDESTRUCTIVE EVALUATION ; 31 ; 46-55
2012-01-01
10 pages
Article (Journal)
English
DDC:
621.1127
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
| British Library Online Contents | 2005
Lamb-Waves for Air-coupled Ultrasonic Testing with one-sided Access
| British Library Conference Proceedings | 2016
Defect detection in thin plates by ultrasonic lamb wave techniques
| British Library Online Contents | 2006
Defect detection in thin plates by ultrasonic lamb wave techniques
| British Library Online Contents | 2006
Detection of internal crack growth in polyethylene pipe using guided wave ultrasonic testing
| Springer Verlag | 2024