Multiple scattering causes the low energy-low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces: Fid-Bau Portal

Multiple scattering causes the low energy-low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces

Madi, C. S. / Aziz, M. J.

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Multiple scattering causes the low energy-low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces

Madi, C. S. / Aziz, M. J.

Multiple scattering causes the low energy-low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces

Madi, C. S. / Aziz, M. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Multiple scattering causes the low energy-low angle constant wavelength topographical instability of argon ion bombarded silicon surfaces

Contributors:

Madi, C. S. (author) / Aziz, M. J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 258 ; 4112-4115

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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