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    Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages

    New search for: Klocek, J.
    New search for: Henkel, K.
    New search for: Kolanek, K.
    New search for: Zschech, E.
    New search for: Schmeiszer, D.

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    Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages

    New search for: Klocek, J.
    New search for: Henkel, K.
    New search for: Kolanek, K.
    New search for: Zschech, E.
    New search for: Schmeiszer, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages

    New search for: Klocek, J.
    New search for: Henkel, K.
    New search for: Kolanek, K.
    New search for: Zschech, E.
    New search for: Schmeiszer, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages

    Contributors:

    Klocek, J. (author) / Henkel, K. (author) / Kolanek, K. (author) / Zschech, E. (author) / Schmeiszer, D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 4213-4221

    Publication date:

    2012-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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