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    High-resolution transmission electron microscopy study on bipolar resistive switching behavior in TiO"2 thin films

    New search for: Li, Y.
    New search for: Zhao, G.
    New search for: Zhou, X.
    New search for: Pan, L.
    New search for: Ren, Y.

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    High-resolution transmission electron microscopy study on bipolar resistive switching behavior in TiO"2 thin films

    New search for: Li, Y.
    New search for: Zhao, G.
    New search for: Zhou, X.
    New search for: Pan, L.
    New search for: Ren, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution transmission electron microscopy study on bipolar resistive switching behavior in TiO"2 thin films

    New search for: Li, Y.
    New search for: Zhao, G.
    New search for: Zhou, X.
    New search for: Pan, L.
    New search for: Ren, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    High-resolution transmission electron microscopy study on bipolar resistive switching behavior in TiO"2 thin films

    Contributors:

    Li, Y. (author) / Zhao, G. (author) / Zhou, X. (author) / Pan, L. (author) / Ren, Y. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 15 ; 37-40

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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